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SEMICONDUCTOR DEVICE INCLUDING FUSE AND METHOD FOR TESTING THE SAME CAPABLE OF SUPPRESSING ERRONEOUS DETERMINATION

机译:包括保险丝的半导体装置和用于测试能够抑制错误测定的相同方法

摘要

In a semiconductor device including first and second power supply terminals, a measuring terminal, and at least one trimming detection circuit connected between the measuring terminal and one of the first and second power supply terminals, the trimming detection circuit is constructed by a current supplying element, a series arrangement of a fuse and a switch element, and a determination circuit. The current supplying element and the series arrangement are connected in series between the measuring terminal and the one of the first and second power supply terminals. The determination circuit has an input connected to a node between the current supplying element and the series arrangement and is adapted to determine whether the fuse is in a connection state or in a disconnection state. A voltage at the other of the first and second power supply terminals is applied to the measuring terminal in a normal mode.
机译:在包括第一和第二电源端子,测量端子以及连接在测量端子与第一和第二电源端子之一之间的至少一个修整检测电路的半导体器件中,修整检测电路由电流供应元件构成。保险丝和开关元件的串联布置以及确定电路。电流供应元件和串联装置串联在测量端子与第一和第二电源端子之一之间。确定电路具有连接到电流供应元件和串联装置之间的节点的输入,并且适于确定保险丝是处于连接状态还是处于断开状态。第一和第二电源端子中的另一个的电压以正常模式施加到测量端子。

著录项

  • 公开/公告号US2009001994A1

    专利类型

  • 公开/公告日2009-01-01

    原文格式PDF

  • 申请/专利权人 KIYOSHI KANNO;

    申请/专利号US20080202903

  • 发明设计人 KIYOSHI KANNO;

    申请日2008-09-02

  • 分类号G01R27/00;

  • 国家 US

  • 入库时间 2022-08-21 19:31:45

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