首页>
外国专利>
SEMICONDUCTOR DEVICE INCLUDING FUSE AND METHOD FOR TESTING THE SAME CAPABLE OF SUPPRESSING ERRONEOUS DETERMINATION
SEMICONDUCTOR DEVICE INCLUDING FUSE AND METHOD FOR TESTING THE SAME CAPABLE OF SUPPRESSING ERRONEOUS DETERMINATION
展开▼
机译:包括保险丝的半导体装置和用于测试能够抑制错误测定的相同方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
In a semiconductor device including first and second power supply terminals, a measuring terminal, and at least one trimming detection circuit connected between the measuring terminal and one of the first and second power supply terminals, the trimming detection circuit is constructed by a current supplying element, a series arrangement of a fuse and a switch element, and a determination circuit. The current supplying element and the series arrangement are connected in series between the measuring terminal and the one of the first and second power supply terminals. The determination circuit has an input connected to a node between the current supplying element and the series arrangement and is adapted to determine whether the fuse is in a connection state or in a disconnection state. A voltage at the other of the first and second power supply terminals is applied to the measuring terminal in a normal mode.
展开▼