首页> 外国专利> Inspection device for inspecting thin plate container and method of inspecting thin plate container

Inspection device for inspecting thin plate container and method of inspecting thin plate container

机译:用于检查薄板容器的检查装置和检查薄板容器的方法

摘要

An inspection device is used for inspecting a thin plate container having a stage guide with insulation property for supporting a thin plate one by one. The inspection device includes a conductive plate having an upper surface and a lower surface and supported on the stage guide; a shaft disposed above the upper surface or below the lower surface; and a contact member abutting against the conductive plate. The conductive plate, the shaft, and the contact member respectively have conductivity.
机译:一种检查装置,用于检查具有台引导件的薄板容器,该台引导件具有用于逐个支撑薄板的绝缘性能。该检查装置包括:导电板,其具有上表面和下表面,并且被支撑在平台引导件上;以及设置在上表面上方或下表面下方的轴;接触构件,其抵接于导电板。导电板,轴和接触构件分别具有导电性。

著录项

  • 公开/公告号US7532004B2

    专利类型

  • 公开/公告日2009-05-12

    原文格式PDF

  • 申请/专利权人 KATSUHIRO YOSHINO;

    申请/专利号US20070730994

  • 发明设计人 KATSUHIRO YOSHINO;

    申请日2007-04-05

  • 分类号G01R31/28;G06F7;

  • 国家 US

  • 入库时间 2022-08-21 19:31:15

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