首页>
外国专利>
Spectroscopic analysis technique for measuring the amount of surface material on wire
Spectroscopic analysis technique for measuring the amount of surface material on wire
展开▼
机译:光谱分析技术,用于测量导线表面材料的含量
展开▼
页面导航
摘要
著录项
相似文献
摘要
In accordance with the present application, a method and system is provided for measuring an amount of surface material on a wire. A section of the wire and a beam generating device configured to generate a high energy beam are placed in a positional relationship with each other. The relationship permits a high energy beam generated from the beam generating device to impinge upon a location on the section of the wire. A reflected beam from the high energy beam is reflected from the section of the wire and is detected by a detector positioned at a location to receive the reflected beam. The beam received by the detector is investigated to determine the characteristics of the surface material on the wire.
展开▼