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Spectroscopic analysis technique for measuring the amount of surface material on wire

机译:光谱分析技术,用于测量导线表面材料的含量

摘要

In accordance with the present application, a method and system is provided for measuring an amount of surface material on a wire. A section of the wire and a beam generating device configured to generate a high energy beam are placed in a positional relationship with each other. The relationship permits a high energy beam generated from the beam generating device to impinge upon a location on the section of the wire. A reflected beam from the high energy beam is reflected from the section of the wire and is detected by a detector positioned at a location to receive the reflected beam. The beam received by the detector is investigated to determine the characteristics of the surface material on the wire.
机译:根据本申请,提供了一种用于测量电线上的表面材料的量的方法和系统。线材的一部分和构造成产生高能束的束产生装置彼此以位置关系放置。该关系允许从束产生装置产生的高能量束撞击到导线的截面上的位置。来自高能束的反射束从导线的截面反射,并被位于接收反射束的位置的检测器检测。研究检测器接收到的光束以确定导线上表面材料的特性。

著录项

  • 公开/公告号US7495766B2

    专利类型

  • 公开/公告日2009-02-24

    原文格式PDF

  • 申请/专利权人 KEVIN BUTLER;ANDRÉ J. SOMMER;

    申请/专利号US20060472696

  • 发明设计人 KEVIN BUTLER;ANDRÉ J. SOMMER;

    申请日2006-06-22

  • 分类号G01N21/84;

  • 国家 US

  • 入库时间 2022-08-21 19:29:45

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