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Systems and methods for LBIST testing using isolatable scan chains
Systems and methods for LBIST testing using isolatable scan chains
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机译:使用可隔离扫描链进行LBIST测试的系统和方法
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摘要
Systems and methods for performing logic built-in self-tests (LBISTs) in digital circuits, where boundary scan chains in functional blocks of the circuits can be selectively coupled/decoupled to isolate the functional blocks during LBIST testing. In one embodiment, processor cores of a multiprocessor chip are isolated and LBIST testing is performed to determine whether any of the processor cores is malfunctioning. If none of the processor cores malfunctions, the processor cores are tested in conjunction with the supporting functional blocks of the device to determine whether the multiprocessor is fully functional. If one or more processor cores malfunctions, these processor cores are isolated and the remaining processor cores are tested in conjunction with the supporting functional blocks of the device to determine whether the multiprocessor operates properly with reduced functionality.
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