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Error correction in interferometry systems

机译:干涉测量系统中的误差校正

摘要

In general, in one aspect, the invention features methods that include using an interferometer to produce an output beam having a phase related to an optical path difference between a path of a first beam and a path of a second beam, wherein the first beam contacts a measurement object and either the measurement object or the interferometer are coupled (e.g., directly attached) to a stage that is moveable within a reference frame. The methods further include monitoring variations in the phase while both varying an orientation of the stage with respect to at least one degree of freedom in the reference frame and keeping a reference mark on the stage in a common position with respect to the reference frame, and determining information based on the monitored variations, the information being related to a contribution to the optical path difference caused by a deviation of the path of the first or second beam from a nominal beam path.
机译:总体上,在一个方面,本发明的特征在于包括使用干涉仪产生具有与第一光束的路径和第二光束的路径之间的光程差有关的相位的相位的输出光束的方法,其中第一光束接触测量对象和测量对象或干涉仪被耦合(例如,直接附接)到在参考框架内可移动的平台。所述方法还包括:监视相位的变化,同时改变相对于参考框架中的至少一个自由度的平台的定向,以及相对于参考框架将平台上的参考标记保持在相同的位置,以及基于所监视的变化确定信息,该信息与由第一或第二光束的路径偏离标称光束路径引起的对光程差的贡献有关。

著录项

  • 公开/公告号US7489407B2

    专利类型

  • 公开/公告日2009-02-10

    原文格式PDF

  • 申请/专利权人 HENRY A. HILL;JEFFREY JOHNSTON;

    申请/专利号US20050246942

  • 发明设计人 HENRY A. HILL;JEFFREY JOHNSTON;

    申请日2005-10-06

  • 分类号G01B11/02;

  • 国家 US

  • 入库时间 2022-08-21 19:28:51

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