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System for measuring the surface geometry and surface evenness of flat products
System for measuring the surface geometry and surface evenness of flat products
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机译:测量扁平产品表面几何形状和表面均匀度的系统
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摘要
The invention relates to a device for producing a pattern on a surface for measuring, using a projector and a slide. The invention also relates to various advantageous embodiments of the measuring system.
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