...
首页> 外文期刊>Measurement >The factors affecting surface roughness measurements of the machined flat and spherical surface structures - The geometry and the precision of the surface
【24h】

The factors affecting surface roughness measurements of the machined flat and spherical surface structures - The geometry and the precision of the surface

机译:影响机加工平面和球形表面结构的表面粗糙度测量的因素-表面的几何形状和精度

获取原文
获取原文并翻译 | 示例

摘要

The quantitative determination of surface roughness is of vital importance in the field of precision engineering. This paper presents an experimental study of the roughness analyses for the flat and spherical surfaces of machined metal in order to compare the roughness data taken from the cloud data produced by the stylus type profilometer and two optical-based measurement instruments, namely the infinite focus microscope and the confocal laser scanning microscope. In this experimental study, the roughness measurements for fifteen flat and six spherical surfaces were repeated six times using three different measurement instruments. Great care was paid to measure the same location for each measurement. For the comparison of the measurement techniques, the same measurement process was applied to the flat and spherical surfaces individually, and the configurations of the measurement instruments (filter type, cut-off, resolution etc.) were synchronized. R_(a), two-dimensional (2D) roughness parameter and S_(a), three-dimensional (3D) roughness parameter were also compared. The measurement results for the samples having spherical surfaces indicated a considerably high difference in values taken from the stylus profilometer and two optical-based measurement instruments in contrast to those for flat surfaces.
机译:表面粗糙度的定量测定在精密工程领域中至关重要。本文对机加工金属的平面和球形表面的粗糙度分析进行了实验研究,以便比较从测针型轮廓仪和两种基于光学的测量仪器(即无限聚焦显微镜)产生的云数据中获取的粗糙度数据和共聚焦激光扫描显微镜。在本实验研究中,使用三种不同的测量仪器对十五个平坦和六个球形表面的粗糙度进行了六次重复测量。在每次测量中都非常谨慎地测量相同的位置。为了比较测量技术,将相同的测量过程分别应用于平面和球形表面,并且使测量仪器的配置(滤波器类型,截止值,分辨率等)同步。还比较了R_(a),二维(2D)粗糙度参数和S_(a),三维(3D)粗糙度参数。与球形表面样品相比,具有球形表面的样品的测量结果表明,从测针轮廓仪和两个基于光学的测量仪器获得的值差异很大。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号