METHOD FOR DETERMINATION OF PARAMETERS, IN PARTICULAR CONCENTRATION AND MOBILITY, OF MINORITY CARRIERS IN SOLID BODIES

摘要

A method relates to solid-state physics and may be used for determination of concentration and mobility of minority carriers in semiconductors, conductors and superconductors. Method for determination of basic parameters, in particular concentration and mobility of minority carriers in solid bodies, consists in experimental measurement of four parameters: inflection point of transversal magnetic resistance, values of specific resistance in absence of the magnetic field in this point, and maximal value thereof. The technical result of the invention is determination of both basic parameters of minority carriers, extension of area of the investigated solid bodies and temperature intervals at which measuring is possible, and simplifications of measuring.