首页> 外国专利> AMORPHOUS COMPOSITE OXIDE FILM, CRYSTALLINE COMPOSITE OXIDE FILM, PROCESS FOR PRODUCING AMORPHOUS COMPOSITE OXIDE FILM, PROCESS FOR PRODUCING CRYSTALLINE COMPOSITE OXIDE FILM, AND COMPOSITE OXIDE SINTER

AMORPHOUS COMPOSITE OXIDE FILM, CRYSTALLINE COMPOSITE OXIDE FILM, PROCESS FOR PRODUCING AMORPHOUS COMPOSITE OXIDE FILM, PROCESS FOR PRODUCING CRYSTALLINE COMPOSITE OXIDE FILM, AND COMPOSITE OXIDE SINTER

机译:非晶态复合氧化物膜,结晶态复合氧化物膜,生产非晶态复合氧化物膜的过程,晶状体复合氧化物膜的生产过程,以及复合氧化物烧结体

摘要

An amorphous film characterized by consisting substantially of indium, tin, magnesium, and oxygen and having a tin content of 5-15% in terms of Sn/(In+Sn+Mg) atom number ratio and a magnesium content of 0.1-2.0% in terms of Mg/(In+Sn+Mg) atom number ratio, with the remainder being indium and oxygen. The film is further characterized by being crystallized by annealing the film at a temperature not higher than 260°C to come to have a resistivity of 0.4 m or lower. An amorphous ITO film for use in producing an ITO thin film for use as, e.g., a display electrode in flat panel displays is obtained by film deposition by sputtering without heating the substrate and without the need of adding water during the film deposition. This amorphous ITO film has the property of being crystallized by annealing at 260°C or lower, which is not so high, and thereby coming to have a reduced resistivity. Also provided are: a process for producing the film; and a sinter for use in the film production.
机译:一种非晶膜,其特征在于基本上由铟,锡,镁和氧组成,锡含量按Sn /(In + Sn + Mg)原子数比计为5-15%,镁含量为0.1-2.0%以Mg /(In + Sn + Mg)原子数比计,其余为铟和氧。该膜的特征还在于,通过在不高于260℃的温度下对膜进行退火以使其具有0.4m或更小的电阻率来结晶。用于生产用作例如平板显示器中的显示电极的ITO薄膜的无定形ITO膜是通过溅射沉积膜而获得的,而无需加热基板并且无需在沉积膜期间添加水即可获得非晶ITO膜。该非晶质ITO膜的特性不是通过在260℃以下进行退火而结晶化的,因此不高,因此电阻率降低。还提供:薄膜的生产方法;以及用于薄膜生产的烧结矿。

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