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METHOD AND SYSTEM FOR REFERENCE-FREE THERMOGRAPHIC DETECTION OF SUBSURFACE DEFECTS USING COMPRESSED IMAGE DATA

机译:利用压缩图像数据进行表面缺陷的无参考热成像检测的方法和系统

摘要

A method and system for non-destructive, reference free thermographic detection of sub-surface defects uses an infrared camera to capture images of a sample (204) that has been heated and allow to cool to equilibrium temperature. The temperature-time data obtained for each pixel in each image is converted into the logarithmic domain and at least squares fit is conducted on the data to generate a polynomial expression corresponding to the temperature-time data for a given pixel (212). This polynomial expression can be transformed into the original time domain to obtain temperature time data with improved signal-to-noise characteristics. Defects can be detected by observing the zero-crossing characteristic of the second derivative of the polynomial (214).
机译:一种用于对表面缺陷进行无损,无参考的热成像检测的方法和系统,该方法和系统使用红外摄像机捕获已加热并允许冷却至平衡温度的样品(204)的图像。将针对每个图像中的每个像素获得的温度时间数据转换为对数域,并对数据进行至少平方拟合,以生成与给定像素的温度时间数据相对应的多项式表达式(212)。可以将该多项式表达式转换为原始时域,以获得具有改进的信噪比特性的温度时间数据。可以通过观察多项式的二阶导数的零交叉特性来检测缺陷(214)。

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