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METHOD AND SYSTEM FOR REFERENCE-FREE THERMOGRAPHIC DETECTION OF SUBSURFACE DEFECTS USING COMPRESSED IMAGE DATA
METHOD AND SYSTEM FOR REFERENCE-FREE THERMOGRAPHIC DETECTION OF SUBSURFACE DEFECTS USING COMPRESSED IMAGE DATA
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机译:利用压缩图像数据进行表面缺陷的无参考热成像检测的方法和系统
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摘要
A method and system for non-destructive, reference free thermographic detection of sub-surface defects uses an infrared camera to capture images of a sample (204) that has been heated and allow to cool to equilibrium temperature. The temperature-time data obtained for each pixel in each image is converted into the logarithmic domain and at least squares fit is conducted on the data to generate a polynomial expression corresponding to the temperature-time data for a given pixel (212). This polynomial expression can be transformed into the original time domain to obtain temperature time data with improved signal-to-noise characteristics. Defects can be detected by observing the zero-crossing characteristic of the second derivative of the polynomial (214).
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