首页> 外国专利> TECHNIQUES FOR MEASURING AND CONTROLLING ION BEAM ANGLE AND DENSITY UNIFORMITY

TECHNIQUES FOR MEASURING AND CONTROLLING ION BEAM ANGLE AND DENSITY UNIFORMITY

机译:离子束角度和密度均匀度的测量与控制技术

摘要

Techniques for measuring and controlling ion beam angle and density uniformity are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus for measuring and controlling ion beam angle and density uniformity. The apparatus may include a measuring assembly having an opening, a cup, and at least one collector at the rear of the cup. The apparatus may further include an actuator to move the measuring assembly along an actuation path to scan an ion beam to measure and control ion beam uniformity.
机译:公开了用于测量和控制离子束角度和密度均匀性的技术。在一个特定的示例性实施例中,该技术可以实现为用于测量和控制离子束角度和密度均匀性的设备。该设备可以包括测量组件,该测量组件具有开口,杯以及在杯的后部处的至少一个收集器。该设备可以进一步包括致动器,以沿着致动路径移动测量组件以扫描离子束以测量和控制离子束均匀性。

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