首页>
外国专利>
DUAL CHANNEL SOURCE MEASUREMENT UNIT FOR SEMICONDUCTOR DEVICE TESTING
DUAL CHANNEL SOURCE MEASUREMENT UNIT FOR SEMICONDUCTOR DEVICE TESTING
展开▼
机译:半导体器件测试用的双通道源测量单元
展开▼
页面导航
摘要
著录项
相似文献
摘要
A dual channel source measurement unit for reliability testing of electrical devices provides a voltage stress stimulus to a device under test and monitors degradation to the device under test caused by the stress simulator. The dual channel source measurement unit decouples the stress and monitor portions of the unit so that the requirements of each can be optimized. Deglitching and current clamp switches can be incorporated in the dual channel source measurement unit to prevent glitches in the switching circuitry and to limit or clamp current flow to or from the monitor and stress sources.
展开▼