首页> 外国专利> METHOD FOR LOCALISED HETERO-EPITAXY ON A DIELECTRIC, IN PARTICULAR GERMANIUM ON SILICON OXIDE, AND METHOD AND SYSTEM FOR MAKING A PRODUCTION BASE OF A HOMOGENEOUS OR HETEROGENEOUS INTEGRATED CIRCUIT

METHOD FOR LOCALISED HETERO-EPITAXY ON A DIELECTRIC, IN PARTICULAR GERMANIUM ON SILICON OXIDE, AND METHOD AND SYSTEM FOR MAKING A PRODUCTION BASE OF A HOMOGENEOUS OR HETEROGENEOUS INTEGRATED CIRCUIT

机译:在氧化硅上介电的,特别是锗上的局部异戊二烯的方法,以及制备均相或异相集成电路的基础的方法和系统

摘要

The invention relates to method for making, by localised hetero-epitaxy, a layer of a semiconductor i.e. of germanium, by lateral growth on the surface of an insulating material covering a semiconductor substrate. The invention also relates to the creation of a production base, or wafer, of a homogeneous or heterogeneous integrated circuit on germanium, and to a system for making such bases. The method comprises: a spatially selective etching producing a composite surface layer including a first material (106, 206) in a first region and a second material (104, 204), wherein the regions are contiguous at least at an interface area (1070, 2070) with a level difference between said first region and said second region; a chemical etching (128, 225) of the first material until a portion (107, 207) of the substrate is exposed in the vicinity of said interface; and the growth (129, 130) of said semiconductor (109, 110) from the exposed so-called germination area (107).
机译:本发明涉及通过局部异质外延在覆盖半导体衬底的绝缘材料的表面上横向生长来制造半导体层(即锗)的方法。本发明还涉及在锗上产生均质或异质集成电路的生产基地或晶片的方法,并涉及用于制造这种基地的系统。该方法包括:空间选择性蚀刻产生复合表面层,该复合表面层包括在第一区域中的第一材料(106、206)和第二材料(104、204),其中,这些区域至少在界面区域(1070)连续。 2070)在所述第一区域和所述第二区域之间具有水平差;对第一材料进行化学蚀刻(128、225),直到在所述界面附近露出衬底的一部分(107、207);所述半导体(109、110)从暴露的所谓的发芽区域(107)的生长(129、130)。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号