SYSTEM AND METHOD TO DETERMINE OPTICAL PARAMETERS OF WAVEGUIDES USING A 3-WAVE INTERFERENCE PATTERN AND A SINGLE ARM INTERFEROMETER

摘要

The present invention relates to a system and method to determine optical parameters of waveguides using a three wave interference pattern and a single arm interferometer. Specifically the invention comprises a radiation source operable to emit radiation connected to a means for separating incident and reflected waves; the means for separating incident and reflected waves further connected to a detector; the means for separating incident and reflected waves having an output arm adjacent to a collimating means, the output arm operable to reflect a test emission from the radiation source back to the detector, the reflection contributing to an interference pattern; and a waveguide having a first end and a second end, the first end being positioned at a balanced distance from the collimating means, the first end and the second end operable to reflect a test emission from the radiation source back to the detector, the reflections contributing to the interference pattern.