首页> 外国专利> SPIN-POLARIZATION ION BEAM GENERATOR, SCATTERING SPECTROSCOPE USING THE SPIN-POLARIZATION ION BEAM, AND SPECIMEN PROCESSING DEVICE

SPIN-POLARIZATION ION BEAM GENERATOR, SCATTERING SPECTROSCOPE USING THE SPIN-POLARIZATION ION BEAM, AND SPECIMEN PROCESSING DEVICE

机译:自旋极化离子束发生器,使用自旋极化离子束的散射光谱和标本处理装置

摘要

A spin polarized ion beam generation apparatus (30) can efficiently generate a spin polarized ion by using a pumping light generator (33) to an ion in a high frequency discharge tube (15) to irradiate optical pumping (33,34) by circularly polarized light and linearly polarized light orthogonal to each other to a metastable atom. For example, a polarized helium ion beam having a spin polarization rate that exceeds 18% and that is as high as 25% can be generated. The spin polarized ion beam generation apparatus (30) also can be applied to a processing apparatus and an analysis apparatus that can irradiate a polarized ion beam to a specimen. According to the spin polarized ion scattering spectroscopy apparatus, the spin status in a region at a depth of about 2 to 3 atomic layers from the surface of the specimen can be measured while discriminating the elements from the atomic layer with a reduced measurement time and with a high accuracy impossible in the conventional technique.
机译:自旋极化离子束产生设备(30)可以通过使用泵浦光发生器(33)对高频放电管(15)中的离子有效地产生自旋极化离子,从而通过圆极化来照射光泵浦(33,34)。正交于亚稳原子的光和线偏振光。例如,可以产生自旋极化率超过18%并且高达25%的极化氦离子束。自旋极化离子束产生装置(30)也可以应用于能够将极化离子束照射到样本的处理装置和分析装置。根据自旋极化离子散射光谱仪,可以在距样品表面约2至3个原子层深度的区域中测量自旋状态,同时以减少的测量时间和通过从原子层中鉴别出元素。传统技术不可能达到的高精度。

著录项

  • 公开/公告号EP2091306A1

    专利类型

  • 公开/公告日2009-08-19

    原文格式PDF

  • 申请/专利权人 JAPAN SCIENCE AND TECHNOLOGY AGENCY;

    申请/专利号EP20070832821

  • 发明设计人 SUZUKI TAKU;YAMAUCHI YASUSHI;

    申请日2007-11-29

  • 分类号H05H1/46;G01N27/64;H01J27/24;H01J37/08;H01J37/252;

  • 国家 EP

  • 入库时间 2022-08-21 19:15:02

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