首页> 外国专利> Spin polarized ion beam generation apparatus and scattering spectroscopy apparatus using the spin polarized ion beam and specimen processing apparatus

Spin polarized ion beam generation apparatus and scattering spectroscopy apparatus using the spin polarized ion beam and specimen processing apparatus

机译:自旋极化离子束产生设备和使用自旋极化离子束的散射光谱设备以及样本处理设备

摘要

A spin polarized ion beam generation apparatus (30) can efficiently generate a spin polarized ion by using a pumping light generator (33) to an ion in a high frequency discharge tube (15) to irradiate optical pumping (33,34) by circularly polarized light and linearly polarized light orthogonal to each other to a metastable atom. For example, a polarized helium ion beam having a spin polarization rate that exceeds 18% and that is as high as 25% can be generated. The spin polarized ion beam generation apparatus (30) also can be applied to a processing apparatus and an analysis apparatus that can irradiate a polarized ion beam to a specimen. According to the spin polarized ion scattering spectroscopy apparatus, the spin status in a region at a depth of about 2 to 3 atomic layers from the surface of the specimen can be measured while discriminating the elements from the atomic layer with a reduced measurement time and with a high accuracy impossible in the conventional technique.
机译:自旋极化离子束产生设备( 30 )可以通过使用泵浦光发生器( 33 )对高频放电管中的离子有效地产生自旋极化离子( 15 )通过圆偏振光和与正交于亚稳态原子的线性偏振光照射光泵浦( 33,34 )。例如,可以产生自旋极化率超过18%并且高达25%的极化氦离子束。自旋极化离子束产生装置( 30 )也可以应用于能够将极化离子束照射到样本的处理装置和分析装置。根据自旋极化离子散射光谱仪,可以在距样品表面约2至3个原子层深度的区域中测量自旋状态,同时以减少的测量时间和通过将原子层中的元素区别开来。传统技术不可能达到的高精度。

著录项

  • 公开/公告号US8017920B2

    专利类型

  • 公开/公告日2011-09-13

    原文格式PDF

  • 申请/专利权人 TAKU SUZUKI;YASUSHI YAMAUCHI;

    申请/专利号US20070516351

  • 发明设计人 TAKU SUZUKI;YASUSHI YAMAUCHI;

    申请日2007-11-29

  • 分类号H01J37/08;H01J37/252;

  • 国家 US

  • 入库时间 2022-08-21 18:10:33

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