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SAMPLE AND HOLD CIRCUIT, AND METHOD FOR REDUCING TIMING MISMATCH IN SAMPLE AND HOLD CIRCUIT

机译:样品和保持电路,以及减少样品和保持电路中的时序不匹配的方法

摘要

The present invention relates to a high-speed sample / hold circuit comprising a plurality of sample / hold subcircuits (sample and hold subcircuits) connected in parallel between the input and the output. Circuit further comprises a plurality of sample / hold circuits connected to the sub-circuit and the correction (calibration circuit). Correction circuit to reduce the number of samples / by operable to change the hold signal for one or more of the hold subcircuits, timing between a plurality of sample / hold subcircuits and the associated distortion mismatch (timing mismatch) can. The invention also includes a method for reducing timing mismatch in high speed parallel-connected sample / hold circuit. The method comprises detecting timing mismatch associated with the plurality of sample / hold subcircuits, and includes changing one or more of the hold signal for the subcircuits. In one exemplary method, the sample / hold circuit converts the output data into digital data, performs a FFT (Fast Fourier Transform) about it, by analyzing the energy spectrum can be obtained as a result, it detects the timing mismatch . ; Sample / hold circuit, a timing mismatch, the calibration circuit, the FFT
机译:高速采样/保持电路技术领域本发明涉及一种高速采样/保持电路,其包括在输入和输出之间并联连接的多个采样/保持子电路(采样和保持子电路)。电路还包括多个连接到子电路和校正(校准电路)的采样/保持电路。校正电路可通过改变一个或多个保持子电路中的一个或多个保持信号,减少多个采样/保持子电路之间的时序以及相关的失真失配(时序失配)来减少采样的数量。本发明还包括一种用于减少高速并联采样/保持电路中的时序失配的方法。该方法包括检测与多个采样/保持子电路相关联的时序失配,并且包括改变用于子电路的一个或多个保持信号。在一种示例性方法中,采样/保持电路将输出数据转换为数字数据,对其进行FFT(快速傅立叶变换),通过分析能谱作为结果而获得,它检测时序失配。 ;采样/保持电路,时序失配,校准电路,FFT

著录项

  • 公开/公告号KR100894378B1

    专利类型

  • 公开/公告日2009-04-22

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20010037195

  • 申请日2001-06-27

  • 分类号H03M1/12;

  • 国家 KR

  • 入库时间 2022-08-21 19:12:02

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