METHOD FOR DETECTING DEFECT IN AN INFRARED DETECTOR BY DIVIDING AN INFRARED DETECTOR IMAGE INTO TWO AREAS

摘要

PURPOSE: A method for detecting defect in an infrared detector is provided to detect defects efficiently and compensate images by detecting defects in the images having divided areas.;CONSTITUTION: A method for detecting defect in an infrared detector comprises following steps. A first image which is classified into a central area and an edge area is inputted. A second image which is different with the first image and is classified into a central area and an edge area is inputted(302). The gain value and the offset of each pixel are calculated in the first and second images(304). The pixel with calculated the gain value and the offset is positioned at the center area or the edge area(306). The defect of corresponding pixels positioned at the center area is detected n consideration of calculated gain value and the offset, and the first threshold value set up in advance. The defect of corresponding pixels positioned at the edge area is detected n consideration of calculated gain value and the offset, and the first threshold value set up in advance.;COPYRIGHT KIPO 2010