首页> 外国专利> METHOD OF MANUFACTURING InAsSb SEMICONDUCTOR ON LATTICE-MISMATCHED SUBSTRATE AND SEMICONDUCTOR DEVICE BY USING THE SAME

METHOD OF MANUFACTURING InAsSb SEMICONDUCTOR ON LATTICE-MISMATCHED SUBSTRATE AND SEMICONDUCTOR DEVICE BY USING THE SAME

机译:通过使用相同的方法在晶格错位的基板和半导体器件上制造InAsSb半导体的方法

摘要

the present invention is a GaAs substrate , Si substrate , such as cost-effective and easy-to- gudeuk semiconductor substrate in InAs (1-x) Sb x provides a semiconductor device manufacturing method for forming a semiconductor layer made of . The present invention is to form the quantum dot layer between the semiconductor substrate and the semiconductor layer to reduce the defects due to the lattice mismatch between the semiconductor substrate and the semiconductor layer . In addition, the present invention can enhance the growth rate of the semiconductor layer , the semiconductor layer formed according to the present invention exhibit a high electron mobility at room temperature . As a result , it is possible to improve the production efficiency and the quality of the semiconductor element .
机译:本发明是GaAs衬底,Si衬底,例如InAs (1-x) Sb x 中具有成本效益且易于制造的半导体衬底。半导体器件的制作方法。本发明是在半导体衬底和半导体层之间形成量子点层,以减少由于半导体衬底和半导体层之间的晶格失配而引起的缺陷。另外,本发明可以提高半导体层的生长速率,根据本发明形成的半导体层在室温下显示出高的电子迁移率。结果,可以提高生产效率和半导体元件的质量。

著录项

  • 公开/公告号KR100921693B1

    专利类型

  • 公开/公告日2009-10-15

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20070106577

  • 发明设计人 장준연;최원준;송진동;임주영;

    申请日2007-10-23

  • 分类号H01L21/20;H01L33/00;

  • 国家 KR

  • 入库时间 2022-08-21 19:11:34

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