首页> 外国专利> Surficial ratio computing method for tomographic image, involves producing contour line in tomographic image, and computing surfaces of regions and surficial ratio based on determined contour lines

Surficial ratio computing method for tomographic image, involves producing contour line in tomographic image, and computing surfaces of regions and surficial ratio based on determined contour lines

机译:断层图像的表面比率计算方法,涉及在断层图像中产生轮廓线,并基于确定的轮廓线计算区域的表面和表面比率

摘要

The method involves determining a contour line (22) for a region. A copied contour line is created and represented in a tomographic image (24). Another contour line (23) is produced in the tomographic image by an interactive adjustment of the copied contour line to another region. Surfaces (20, 21) of the regions and surficial ratio (31) are computed based on the determined contour lines. The contour line (22) is determined automatically based on digital image processing methods. The contour line (20) is superimposed in the tomographic image. An independent claim is also included for a tomography equipment provided with control and computer units.
机译:该方法包括确定区域的轮廓线(22)。创建复制的轮廓线并将其表示在断层图像中(24)。通过将复制的轮廓线交互式调整到另一个区域,可以在断层图像中生成另一个轮廓线(23)。基于所确定的轮廓线计算区域的表面(20、21)和表面比率(31)。基于数字图像处理方法自动确定轮廓线(22)。等高线(20)叠加在断层图像中。对于包括控制单元和计算机单元的层析成像设备也包括独立权利要求。

著录项

  • 公开/公告号DE102007041459A1

    专利类型

  • 公开/公告日2009-03-05

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE20071041459

  • 发明设计人 BIERMANN CHRISTINA;BAKAI ANNEMARIE;

    申请日2007-08-31

  • 分类号A61B19/00;A61B5/055;A61B6/03;G06T7/60;

  • 国家 DE

  • 入库时间 2022-08-21 19:09:40

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