首页> 外国专利> Method for determining measuring instrument interferences in system, involves implementing multiple measurements and redundant measuring instruments of system measure simultaneously measured value with each measurement

Method for determining measuring instrument interferences in system, involves implementing multiple measurements and redundant measuring instruments of system measure simultaneously measured value with each measurement

机译:确定系统中测量仪器干扰的方法,涉及实现多个测量,并且冗余测量仪器系统每次测量时同时测量测量值

摘要

The method involves implementing multiple measurements. The redundant measuring instruments of the system measure simultaneously a measured value with each measurement. The measured value is detected by the redundant measuring instruments. A characteristic value is computed for each measurement based on the three base items. The middle upgrade of a section of a smoothed curve is provided, which represents an approximate function of the difference of the measured values during the measurements. An independent claim is included for a device for the execution of the method.
机译:该方法涉及实施多个测量。系统的冗余测量仪器会在每次测量时同时测量一个测量值。测量值由冗余测量仪器检测。基于三个基本项目为每个测量计算一个特征值。提供了平滑曲线的一部分的中间升级,该中间升级表示测量期间测量值差异的近似函数。为用于执行该方法的设备包括独立权利要求。

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