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Method for characterizing particles, involves irradiating particles with visible light, detecting light reflected or radiated by particles, and irradiating particles with ultraviolet light
Method for characterizing particles, involves irradiating particles with visible light, detecting light reflected or radiated by particles, and irradiating particles with ultraviolet light
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机译:表征颗粒的方法,包括用可见光照射颗粒,检测由颗粒反射或辐射的光以及用紫外线照射颗粒
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摘要
The method involves irradiating particles (1) with visible light. The light reflected or radiated by the particles is detected. The particles are irradiated with ultraviolet light. The visible light radiated from the particles is detected. The particles are characterized depending on the detected light. A binary image is prepared from the particles. An independent claim is included for a device for characterizing particles with a light source for visible light.
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