Electrostatic discharge protection device and method for protecting semiconductor components in the case of electrostatic discharge events

摘要

A process for the protection of an input of a semiconductor structure, in the case of an electrostatic discharge event, wherein said method comprises the steps of:Providing a first diode (130) and a second diode (122) having an input are connected in series;Biasing of the first diode and the second diode in the direction of flow; andShort-circuiting of the first or the second diode during the occurrence of an electrostatic discharge event.