Semiconductor component e.g. dynamic RAM, for use in electronic data processing system, has selection circuit designed such that circuit parts of component is supplied with supplying voltage or with test voltage

摘要

The component has a selection circuit, which is designed such that circuit parts e.g. memory arrays, of the component is supplied with a supplying voltage (Vintern) or with a test voltage (Vtest) to selectively test the functionality of individual circuit parts e.g. memory cells, or circuit blocks with the circuit parts of the component. The selection circuit is adjustable such that an internal test voltage is applied to the testing circuit parts or circuit blocks during a test operation, while an internal supply voltage is applied to non-testing circuit parts or circuit blocks. An independent claim is also included for a method for testing a semiconductor component with integrated circuit parts and with an integrated selection circuit.