首页> 外国专利> A method for generating a deformed channel region in a transistor by a depth implantation of a deformation induzier ends of the type under the channel region

A method for generating a deformed channel region in a transistor by a depth implantation of a deformation induzier ends of the type under the channel region

机译:一种通过深度注入沟道区下方的类型的变形工业端在晶体管中产生变形沟道区的方法

摘要

By incorporation of a carbon locations at the channel region of a p - channel transistor in front of the production of the gate electrodes structure can be a more efficient deformation inducing mechanism are provided, as a result of which the performance of p - transistors is improved. The position and the size of the deformation induzier ends area, on the basis of an implantation mask and implanting parameters are determined, so that a high degree of compatibility with conventional trechniken is created, since the verformungsinduzuierende area during an early process step can be installed.
机译:通过在栅电极结构的制造之前在p-沟道晶体管的沟道区域处并入碳位置,可以提供更有效的变形诱导机制,结果,改善了p-晶体管的性能。基于植入掩模和植入参数,确定变形工业端部区域的位置和大小,从而可与常规trechniken高度兼容,因为可以在早期加工步骤中安装verformungsinduzuierende区域。

著录项

  • 公开/公告号DE102008006961A1

    专利类型

  • 公开/公告日2009-08-27

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20081006961

  • 发明设计人

    申请日2008-01-31

  • 分类号H01L21/8238;H01L21/336;H01L27/092;H01L29/78;

  • 国家 DE

  • 入库时间 2022-08-21 19:09:17

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