首页> 外国专利> Pulling up a silicon single crystal by Magnetic field applied Czochralski method comprises increasing and decreasing neck diameter to grow the neck, and controlling neck diameter variation rate within predetermined range

Pulling up a silicon single crystal by Magnetic field applied Czochralski method comprises increasing and decreasing neck diameter to grow the neck, and controlling neck diameter variation rate within predetermined range

机译:通过施加磁场的切克劳斯基法提拉硅单晶包括增大和减小颈部直径以使颈部生长,以及将颈部直径变化率控制在预定范围内

摘要

Pulling up a silicon single crystal (4) comprises bringing seed crystal (1) into contact with material silicon melt (5), pulling up the seed crystal, growing a neck (2), and increasing a diameter to grow a single crystal with predetermined crystal diameter. The neck diameter is increased and decreased to grow the neck, during which a neck diameter variation rate is 0.05-0.5, assuming that a quotient of a neck diameter difference between adjoining inflection points of the increasing and decreased neck diameter over a neck length between the inflection points is the neck diameter variation rate.
机译:提起硅单晶(4)包括使籽晶(1)与材料硅熔体(5)接触,提起籽晶,生长颈(2)并增大直径以生长具有预定晶格的单晶晶体直径。假设增大和减小颈部直径的相邻拐点之间的颈部直径差在整个颈部长度之间的商,则颈部直径增大和减小以生长颈部,在此期间颈部直径变化率为0.05-0.5。拐点是颈部直径的变化率。

著录项

  • 公开/公告号DE102008036615A1

    专利类型

  • 公开/公告日2009-02-12

    原文格式PDF

  • 申请/专利权人 COVALENT MATERIALS CORP.;

    申请/专利号DE20081036615

  • 发明设计人 MINAMI TOSHIRO;

    申请日2008-08-06

  • 分类号C30B15/00;C30B15/36;

  • 国家 DE

  • 入库时间 2022-08-21 19:09:07

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