首页> 外国专利> FIELD EFFECT TRANSISTOR USING AMORPHOUS OXIDE FILM AS CHANNEL LAYER, METHOD FOR MANUFACTURING FIELD EFFECT TRANSISTOR USING AMORPHOUS OXIDE FILM AS CHANNEL LAYER, AND METHOD FOR MANUFACTURING AMORPHOUS OXIDE FILM

FIELD EFFECT TRANSISTOR USING AMORPHOUS OXIDE FILM AS CHANNEL LAYER, METHOD FOR MANUFACTURING FIELD EFFECT TRANSISTOR USING AMORPHOUS OXIDE FILM AS CHANNEL LAYER, AND METHOD FOR MANUFACTURING AMORPHOUS OXIDE FILM

机译:以非晶态氧化物膜为通道层的场效应晶体管,以非晶态氧化物膜为通道层的场效应晶体管的制造方法以及非晶态氧化物膜的制造方法

摘要

PROBLEM TO BE SOLVED: To reduce hysteresis by devising an oxide material to be used for a channel of a transistor.;SOLUTION: The method for manufacturing an amorphous oxide film which is used for a channel layer of a field effect transistor and contains Ga, In and Zn, In, Zn, Ga and Mg, In and Sn, In and Ga, or In and Zn includes: a process for arranging a substrate in a film formation device; and a process for forming an amorphous oxide film on the substrate by a sputtering film formation method while leading hydrogen gas and oxygen gas into the film formation device at respective partial pressures of 0.001 to 0.01 Pa and 0.008 to 0.5 Pa.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:通过设计用于晶体管的沟道的氧化物材料来减少磁滞。解决方案:用于制造非晶氧化物膜的方法,该膜用于场效应晶体管的沟道层并包含Ga, In和Zn,In,Zn,Ga和Mg,In和Sn,In和Ga或In和Zn包括:在膜形成装置中布置基板的工艺;以及通过溅射成膜方法在基板上形成非晶氧化物膜的工艺,同时将氢气和氧气分别以0.001至0.01 Pa和0.008至0.5 Pa的分压引入成膜装置。 )2010,JPO&INPIT

著录项

  • 公开/公告号JP2010183108A

    专利类型

  • 公开/公告日2010-08-19

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP20100108104

  • 发明设计人 IWASAKI TATSUYA;

    申请日2010-05-10

  • 分类号H01L29/786;H01L21/336;H01L21/363;

  • 国家 JP

  • 入库时间 2022-08-21 19:06:01

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号