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ELECTRONIC APPARATUS AND CONNECTION FAILURE DETECTING METHOD OF ELECTRONIC COMPONENT USING ELECTRONIC APPARATUS

机译:电子仪器及使用电子仪器的电子部件的连接故障检测方法

摘要

PROBLEM TO BE SOLVED: To detect breakage in a junction which joins a circuit board to an electronic component with sufficient accuracy in advance.;SOLUTION: An electronic apparatus includes: a chip component 11 which includes external electrodes; a first solder joint 16-1 for chip which is formed on a first and a second electrode pads 15-1 and 15-2 and is joined to one external electrode 13; a second solder joint 16-2 for chip which is formed on a third electrode pad 15-3 and is joined to the other external electrode 13; and a resistance measuring circuit 18 which is formed on a circuit board 14 and measures a resistance between the first and the second electrode pads 15-1 and 15-2. The first electrode pad 15-1 is formed so that the breakage life of the first solder joint 16-1 for chip determined by the area of the first electrode pad 15-1 become shorter than the breakage life of a solder joint for a semiconductor package which mounts the semiconductor package on the circuit board 14 in the proximity of the chip component 11.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:预先以足够的精度检测将电路板连接至电子部件的接合处的破损。解决方案:一种电子设备,包括:芯片部件11,其包括外部电极;以及第一芯片焊点16-1,其形成在第一和第二电极焊盘15-1和15-2上,并与一个外部电极13接合;第二芯片用焊点16-2形成在第三电极焊盘15-3上并与另一个外部电极13接合。电阻测量电路18形成在电路板14上,并测量第一和第二电极焊盘15-1和15-2之间的电阻。形成第一电极焊盘15-1,使得由第一电极焊盘15-1的面积确定的用于芯片的第一焊点16-1的断裂寿命变得比用于半导体封装的焊点的断裂寿命短。其将半导体封装件安装在电路板14上靠近芯片组件11的位置;版权所有:(C)2010,JPO&INPIT

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