首页> 外国专利> APPARATUS FOR MASS-PRODUCING SILICON-BASED THIN FILM, AND METHOD FOR MASS-PRODUCING THE SILICON-BASED THIN FILM

APPARATUS FOR MASS-PRODUCING SILICON-BASED THIN FILM, AND METHOD FOR MASS-PRODUCING THE SILICON-BASED THIN FILM

机译:用于大量生产基于硅的薄膜的装置和用于大量生产基于硅的薄膜的方法

摘要

PROBLEM TO BE SOLVED: To provide a silicon-group thin-film mass-production equipment which is less apt to cause in-plane film-thickness distribution and is capable of reducing the size of a configuration.;SOLUTION: A plasma is generated in the silicon-group thin-film mass-production equipment 10 for producing a silicon-group thin film in each of transparent electrodes 62, by arranging each of the transparent electrodes 62 to face in parallel to each of a plurality of opposite electrodes 16 with some gap; introducing the material gas of the silicon-group thin film into a chamber 12; and applying a DC pulse voltage, sequentially or all together, to each of the opposite electrodes 16. Since the silicon-group thin film is produced by applying the DC pulse voltage, a high-frequency plasma-density distribution is less apt to be generated, as in a manner of applying a high-frequency intermittently to discharge it, and also the in-plane film-thickness distribution is less apt to be generated. Furthermore, turning-on period can be shortened, because the DC pulse voltage rises abruptly; consequently, a sheath can stop growing thicker at a transient state, before going into a steady state, which results in narrowing down of the interval between the opposite electrode 16 and the transparent electrode 62, and in size reduction of the equipment.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种硅基薄膜批量生产设备,该设备不易引起面内膜厚度分布,并且能够减小结构尺寸。通过将每个透明电极62布置成与多个相对电极16中的每一个平行面对,在每个透明电极62中制造硅基薄膜的硅族薄膜大量生产设备10间隙;将硅族薄膜的原料气体引入腔室12中;然后,将直流脉冲电压依次或全部施加到对置电极16上。由于通过施加直流脉冲电压来制作硅系薄膜,因此不易产生高频等离子体密度分布。如同间歇地施加高频以将其放电的方式一样,面内膜厚分布也不易产生。另外,由于直流脉冲电压急剧上升,因此可以缩短接通时间。因此,护套可以在进入稳态之前在过渡状态下停止增厚,这导致相对电极16和透明电极62之间的间隔变窄,并且设备尺寸减小。 (C)2010,日本特许厅&INPIT

著录项

  • 公开/公告号JP2009267383A

    专利类型

  • 公开/公告日2009-11-12

    原文格式PDF

  • 申请/专利权人 NGK INSULATORS LTD;

    申请/专利号JP20090073668

  • 申请日2009-03-25

  • 分类号H01L21/205;H01L31/04;H05H1/24;H05H1/46;C23C16/515;

  • 国家 JP

  • 入库时间 2022-08-21 19:05:32

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