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ANTI-REFRACTION PROPERTY TESTING METHOD AND ANTI-REFRACTION PROPERTY TESTER

机译:抗折性能测试方法及抗折性能测试仪

摘要

PROBLEM TO BE SOLVED: To provide an anti-refraction property testing method which enables the efficient obtaining of anti-refraction property data, which has precision equal to or higher than that of a result obtained from a conventional testing method and also satisfies reliability, in a short time, and an anti-refraction property tester.;SOLUTION: The anti-refraction property testing method is characterized in that the number of times of refraction resistance of the individual lead of a test piece for an anti-refraction property test is calculated using the breaking function of a lead part, which connects at least two leads in parallel to each other, calculated from measured data composed of the change with the elapse of time of the voltage or electric resistance value of the lead part when the test piece for the anti-refraction property test equipped with the lead part is repeatedly bent at a predetermined position or both of the voltage and the electric resistance value and the number of times of refraction.;COPYRIGHT: (C)2010,JPO&INPIT
机译:要解决的问题:提供一种抗折射特性测试方法,该方法能够有效地获得抗折射特性数据,其精度等于或高于常规测试方法获得的结果,并且还满足可靠性要求。解决方案:该抗折射特性测试方法的特征在于,计算出用于抗折射特性测试的测试件的单根引线的抗折射次数。使用引线部分的断裂功能,该函数将至少两个彼此平行的引线相互连接,这是根据测量数据计算得出的,该测量数据由引线部分的电压或电阻值随时间的变化而变化。将配备有引线部分的抗折光性测试重复弯曲到预定位置或电压,电阻值和数值折射次数;版权:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010008281A

    专利类型

  • 公开/公告日2010-01-14

    原文格式PDF

  • 申请/专利权人 SUMITOMO METAL MINING CO LTD;

    申请/专利号JP20080169176

  • 发明设计人 NAITO HIROSHI;

    申请日2008-06-27

  • 分类号G01N3/20;G01N3/00;

  • 国家 JP

  • 入库时间 2022-08-21 19:04:42

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