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ANTI-REFRACTION PROPERTY TESTING METHOD AND ANTI-REFRACTION PROPERTY TESTER
ANTI-REFRACTION PROPERTY TESTING METHOD AND ANTI-REFRACTION PROPERTY TESTER
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机译:抗折性能测试方法及抗折性能测试仪
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摘要
PROBLEM TO BE SOLVED: To provide an anti-refraction property testing method which enables the efficient obtaining of anti-refraction property data, which has precision equal to or higher than that of a result obtained from a conventional testing method and also satisfies reliability, in a short time, and an anti-refraction property tester.;SOLUTION: The anti-refraction property testing method is characterized in that the number of times of refraction resistance of the individual lead of a test piece for an anti-refraction property test is calculated using the breaking function of a lead part, which connects at least two leads in parallel to each other, calculated from measured data composed of the change with the elapse of time of the voltage or electric resistance value of the lead part when the test piece for the anti-refraction property test equipped with the lead part is repeatedly bent at a predetermined position or both of the voltage and the electric resistance value and the number of times of refraction.;COPYRIGHT: (C)2010,JPO&INPIT
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