PROGRAM OR SYSTEM FOR USE LIMIT ESTIMATION ANALYSIS OF SEMICONDUCTOR STORAGE DEVICE

摘要

PPROBLEM TO BE SOLVED: To provide a program for a use limit estimated time analysis of a semiconductor storage device that can specify a use limit estimated time (an estimated life) from immediately after starting to use a new semiconductor storage device. PSOLUTION: The program for the use limit estimated time analysis of the semiconductor storage device provides: a maximum value computing process for computing the maximum value of an erase count from the capacity of the semiconductor storage device and storing it in a storage means; an erase count acquisition process for acquiring the erase count every fixed cycle; and an erase count storage process for storing the erase count and the acquisition time of the erase count in the storage means; an arithmetic process for computing a rise coefficient based on the temporal transition of the erase count on condition that the erase count acquisition process was carried out a plurality of times, and computing the use limit estimated time of the semiconductor storage device in relation to the maximum value of the erase count stored in the storage means; and a use limit display output process for outputting use limit estimation information to a display means from a display/output means based on the use limit estimated time computed in the arithmetic process. PCOPYRIGHT: (C)2010,JPO&INPIT