DEVICE FOR INSPECTING FOOD QUALITY, FOOD COMPOSITION, FOREIGN MATTER COMPOSITION, EATING QUALITY AND CHANGE STATE

摘要

PPROBLEM TO BE SOLVED: To provide a device for inspecting food quality at high sensitivity using an InP system photodiode having reduced dark current and expanded reception sensitivity to a wavelength of 1.8 m without employing a cooling mechanism or the like. PSOLUTION: A light-receiving layer 3 has multiple quantum well structure of a III-V group semiconductor, pn junction 15 is formed by selectively diffusing impurity elements in the light-receiving layer, impurity concentration in the light-receiving layer is 510SP16/SP/cmSP3/SP, and the device for inspecting the food quality receives light with at least one wavelength included in an absorption band of water with a wavelength of 3 m to perform inspection. PCOPYRIGHT: (C)2010,JPO&INPIT