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Defect detection apparatus, a defect detection method, defect detection program, and computer-readable recording medium storing the program

机译:缺陷检测设备,缺陷检测方法,缺陷检测程序以及存储该程序的计算机可读记录介质

摘要

PROBLEM TO BE SOLVED: To detect a defect with high precision by suppressing the occurrence of a false defect.;SOLUTION: A defect detecting apparatus 1 includes a first difference operating circuit 23a for calculating the differences between the brightness values (P1-P8) of the respective comparing target pixels contained in a comparing target pixel group and the brightness value (P0) of an inspection target pixel, a second difference operating circuit 23b for calculating the differences between the brightness values (P1'-P8') of the respective comparing target pixels contained in the comparing target pixel group and the brightness value (P0) of the inspection target pixel, a comparing/selecting circuit 24 for selecting the difference smallest in absolute value among the calculated differences as a defect detecting index, and a defect decision part 13 for determining the presence of the defect at the position corresponding to the inspection target pixel of an inspection target from the magnitude relationship of the defect detecting index selected by the comparing/selecting circuit 24 with a predetermined threshold. Accordingly, the defect can be detected with high precision by suppressing the occurrence of the false defect.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:通过抑制假缺陷的发生来高精度地检测缺陷。解决方案:缺陷检测设备1包括第一差运算电路23a,用于计算亮度差(P1-P8)之间的差。包含在比较目标像素组中的各个比较目标像素和检查目标像素的亮度值(P0),第二差分运算电路23b,用于计算各个比较目标的亮度值(P1'-P8')之间的差包含在比较目标像素组中的目标像素和检查目标像素的亮度值(P0),比较/选择电路24,用于从计算出的差异中选择绝对值最小的差异作为缺陷检测指标,以及缺陷判定部13,用于从所述检测部确定与检查对象的检查对象像素对应的位置处的缺陷的存在。比较/选择电路24选择的具有预定阈值的缺陷检测指标的大小关系。因此,通过抑制假缺陷的发生,可以高精度地检测缺陷。; COPYRIGHT:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP4528850B2

    专利类型

  • 公开/公告日2010-08-25

    原文格式PDF

  • 申请/专利权人 シャープ株式会社;

    申请/专利号JP20080217392

  • 发明设计人 中西 秀信;

    申请日2008-08-26

  • 分类号G01N21/956;G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-21 19:00:49

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