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Contact interfacial area evaluation apparatus and method of evaluating the contact interfacial area

机译:接触界面面积评估装置和评估接触界面面积的方法

摘要

PROBLEM TO BE SOLVED: To evaluate a contact interface area between solid objects in a molecular level.;SOLUTION: The contact interface area between at least two kinds of the first solid object and the second solid object having each different photorefractive index is evaluated by using an optical waveguide spectroscopy utilizing an evanescent wave generated on the contact interface between the first solid object used as an optical waveguide and the second solid object in contact with the first solid object. When incident light is totally reflected by the contact interface between the first solid object and the second solid object, an evanescent wave absorbing material or a material generating specific light by absorbing the evanescent wave is added to the second solid object, and the intensity of outgoing light is detected, to thereby evaluate the contact interface area between the first solid object and the second solid object.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:在分子水平上评估固体物体之间的接触界面面积;解决方案:通过使用以下方法评估至少两种分别具有不同光折射率的第一固体物体和第二固体物体之间的接触界面面积利用在用作光波导的第一固体物体和与第一固体物体接触的第二固体物体之间的接触界面上产生的e逝波的光波导光谱学。当入射光被第一固体物体和第二固体物体之间的接触界面完全反射时,将van逝波吸收材料或通过吸收van逝波产生特定光的材料添加到第二固体物体,并且出射强度检测到光,从而评估第一固体和第二固体之间的接触界面区域。;版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP4546861B2

    专利类型

  • 公开/公告日2010-09-22

    原文格式PDF

  • 申请/专利权人 住友ゴム工業株式会社;

    申请/专利号JP20050084676

  • 发明设计人 多田 俊生;西岡 和幸;

    申请日2005-03-23

  • 分类号G01N19/04;G01N21/27;G01N21/64;G01B11/28;

  • 国家 JP

  • 入库时间 2022-08-21 19:00:34

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