首页> 外国专利> Ion beam implanter, the energy measuring device of the ion beam, and a method of measuring the average kinetic energy of the ions

Ion beam implanter, the energy measuring device of the ion beam, and a method of measuring the average kinetic energy of the ions

机译:离子束注入机,离子束能量测量装置以及测量离子平均动能的方法

摘要

PROBLEM TO BE SOLVED: To provide a flight time energy measuring device for measuring and controlling ion beam energy and an ion implantation device including the measuring device.;SOLUTION: An ion implantation system includes an ion source, an ion accelerator and a beam forming and beam directing device, and an ion beam 14 constitutes a series of ion pulses having a preset frequency. An energy measuring device 200 has first and the second sensors 210 and 220, a timing circuit 204 and a conversion circuit 206 for measuring the mean ion kinetic energy. When an ion beam 14 passes each of the sensors 210 and 220, a signal is generated therefrom and the timing circuit 204 determines a time elapsed for selected ion pulses to travel along the distance between the first and the second sensors 210 and 220. In addition, the timing circuit 204 calculates the mean number of ion pulses for finding an offset time. The conversion circuit 206 converts the elapsed time to the measurement value of ion beam energy.;COPYRIGHT: (C)2000,JPO
机译:解决的问题:提供一种用于测量和控制离子束能量的飞行时间能量测量装置以及包括该测量装置的离子注入装置。解决方案:离子注入系统包括离子源,离子加速器和束形成装置,以及离子束导向装置,离子束14构成一系列具有预设频率的离子脉冲。能量测量装置200具有第一传感器210和第二传感器220,用于测量平均离子动能的定时电路204和转换电路206。当离子束14通过传感器210和220中的每一个时,从中产生信号,并且定时电路204确定所选择的离子脉冲沿着第一传感器210和第二传感器220之间的距离行进的时间。 ,定时电路204计算离子脉冲的平均数以求出偏移时间。转换电路206将经过的时间转换为离子束能量的测量值。COPYRIGHT:(C)2000,JPO

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号