首页> 外国专利> Polishing method of the compound semiconductor substrate, compound semiconductor substrate, method of manufacturing a compound semiconductor epitaxial substrate and a compound semiconductor epitaxial substrate

Polishing method of the compound semiconductor substrate, compound semiconductor substrate, method of manufacturing a compound semiconductor epitaxial substrate and a compound semiconductor epitaxial substrate

机译:化合物半导体衬底的抛光方法,化合物半导体衬底,化合物半导体外延衬底的制造方法和化合物半导体外延衬底

摘要

PROBLEM TO BE SOLVED: To provide the method of polishing a compound semiconductor substrate in which oxygen on the surface of the compound semiconductor substrate is reduced, the compound semiconductor substrate, the method of manufacturing a compound semiconductor epi-substrate, and the compound semiconductor epi-substrate.;SOLUTION: The method of polishing a compound semiconductor substrate comprises a preparation step (S10), a first polishing step (S20), and a second polishing step (S30). The compound semiconductor substrate is prepared in the preparation step (S10). The compound semiconductor substrate is polished by use of abrasive powder containing chlorine element in the first polishing step (S20). The substrate is polished by use of an alkaline aqueous solution which contains an inorganic builder and the pH of which is equal to or more than 8.5 and equal to or less than 13.0 in the second polishing step (S30) after the first polishing step (S20).;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供抛光其中化合物半导体衬底的表面上的氧被还原的化合物半导体衬底的方法,化合物半导体衬底,化合物半导体外延衬底的制造方法以及化合物半导体外延解决方案:抛光化合物半导体衬底的方法包括制备步骤(S10),第一抛光步骤(S20)和第二抛光步骤(S30)。在制备步骤(S10)中制备化合物半导体衬底。在第一抛光步骤(S20)中,通过使用含氯元素的研磨粉来抛光化合物半导体基板。在第一抛光步骤(S20)之后的第二抛光步骤(S30)中,通过使用含有无机助洗剂且其pH等于或大于8.5且等于或小于13.0的碱性水溶液对基板进行抛光。 );版权:(C)2009,日本特许厅和INPIT

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号