首页> 外国专利> Physical quantity measuring device of optical frequency domain reflectometry measurement system, and, temperature and strain simultaneous measurement method of using the same

Physical quantity measuring device of optical frequency domain reflectometry measurement system, and, temperature and strain simultaneous measurement method of using the same

机译:光频域反射法测量系统的物理量测量装置及其使用的温度和应变同时测量方法

摘要

A physical quantity measuring apparatus utilizing optical frequency domain reflectometry of the invention includes a tunable laser emits measuring light; a first polarization-maintaining fiber with one end thereof connected with the tunable laser; a polarization-maintaining coupler connected with another end of the first polarization-maintaining fiber; a second polarization-maintaining fiber with one end thereof connected with the polarization-maintaining coupler and another end thereof being a referential reflecting end; a third polarization-maintaining fiber with one end thereof connected with the polarization-maintaining coupler; a sensor consists of fiber Bragg gratings formed at a core of the third polarization-maintaining fiber; a fourth polarization-maintaining fiber with one end thereof connected with the polarization-maintaining coupler; a photodiode connected with the polarization-maintaining coupler via the fourth polarization-maintaining fiber, and detects Bragg reflected light from the sensor and reference light from the referential reflecting end; a controller detects a modulation of an interference intensity between the Bragg reflected light and the reference light, based on an intensity change of multiplexed light of the Bragg reflected light and the reference light detected by the photodiode; an incidence part inputs the measuring light to both two orthogonal polarization axes of the second polarization-maintaining fiber and two orthogonal polarization axes of the third polarization-maintaining fiber; and an optical path-length adjuster arranged on the third polarization-maintaining fiber, and keeps an optical path-length of the Bragg reflected light from the two orthogonal polarization axes at the sensor at a constant length; the incidence part provided on the first polarization-maintaining fiber, or on both the second and third polarization-maintaining fibers.
机译:本发明的利用光频域反射法的物理量测量装置,包括:可调激光器,其发出测量光。第一保偏光纤,其一端与可调激光器连接;与第一保偏光纤的另一端连接的保偏耦合器;第二保偏光纤,其一端与保偏耦合器相连,另一端为参考反射端。第三保偏光纤,其一端与保偏耦合器连接;传感器由在第三保偏光纤的芯部形成的布拉格光纤光栅构成。第四保偏光纤,其一端与保偏耦合器连接。光电二极管通过第四偏振保持光纤与偏振保持耦合器连接,并检测来自传感器的布拉格反射光和来自参考反射端的参考光。控制器基于布拉格反射光和由光电二极管检测到的参考光的复用光的强度变化,检测布拉格反射光与参考光之间的干涉强度的调制。入射部分将测量光输入到第二保偏光纤的两个正交偏振轴和第三保偏光纤的两个正交偏振轴。所述光路长度调整器配置在所述第三偏振波保持光纤上,使来自所述两个正交偏振轴的布拉格反射光在所述传感器处的光路长度保持恒定。入射部分设置在第一保偏光纤上,或者设置在第二和第三保偏光纤上。

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