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Synchrotron radiation measuring apparatus and method

机译:同步辐射测量装置和方法

摘要

PROBLEM TO BE SOLVED: To shorten the measuring time, and to prolong the life of a device by providing a measuring means for directly receiving the beam from a light source with plural light receiving means and a computing means for computing the predetermined parameter of a beam intensity profile on the basis of the information of plural beam intensity obtained by the measuring means. ;SOLUTION: Two photodiodes 7 and one photodiode 8 are provided in the downstream of a filter 16 at positions corresponding to two pin holes 2 and one vertical slit 4 provided in an aperture plate 5 so as to directly receive the beam outgoing from the synchrotron radiation light. Plural beam intensity obtained by receiving the light is substituted in calibration function previously accumulated and decided, and thickness of the beam and position Y are thereby computed. These computing can be performed in a short time by converting the output of the photodiodes 7, 8 to numerical values while using an analog/ digital converter, and processing while using a computer, and fluctuation in a short time can be accurately performed.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:通过提供一种具有多个光接收装置的用于直接接收来自光源的光束的测量装置以及用于计算光束的预定参数的计算装置,来缩短测量时间并延长设备的使用寿命。基于由测量装置获得的多束强度信息的强度分布。 ;解决方案:在滤波器16的下游,在与设置在孔径板5中的两个销孔2和一个垂直狭缝4相对应的位置处,提供两个光电二极管7和一个光电二极管8,以便直接接收从同步加速器辐射射出的光束光。通过接收光而获得的多个光束强度被替换为预先累积并确定的校准函数,从而计算光束的厚度和位置Y。通过在使用模数转换器的同时将光电二极管7、8的输出转换为数值,并在使用计算机的处理下,可以在短时间内执行这些计算,并且可以在短时间内准确地进行波动。 :(C)2001,日本特许厅

著录项

  • 公开/公告号JP4392933B2

    专利类型

  • 公开/公告日2010-01-06

    原文格式PDF

  • 申请/专利权人 キヤノン株式会社;

    申请/专利号JP20000013199

  • 发明设计人 渡辺 豊;三宅 明;

    申请日2000-01-21

  • 分类号H05H13/04;G21K5/02;G21K7/00;

  • 国家 JP

  • 入库时间 2022-08-21 18:57:04

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