首页>
外国专利>
SILICON MATERIAL SURFACE ETCHING FOR LARGE POLYSILICON THIN FILM DEPOSITION AND STRACTURE
SILICON MATERIAL SURFACE ETCHING FOR LARGE POLYSILICON THIN FILM DEPOSITION AND STRACTURE
展开▼
机译:用于大型多晶硅薄膜沉积和结构的硅材料表面蚀刻
展开▼
页面导航
摘要
著录项
相似文献
摘要
A method for forming a photovoltaic cell. The method includes providing a first silicon material characterized by a resistivity less than about 0.5 ohm cm−1 and a first conductive type impurity characteristic. The first silicon material forms a first conductor layer for a photovoltaic cell. The method deposits a polysilicon film material overlying the surface region. In a specific embodiment, the polysilicon material has the first conductive type impurity characteristics and a resistivity greater than about 0.5 ohm cm−1. In a specific embodiment, the first polysilicon film material is characterized by a grain size greater than about 0.1 mm. The method forms a second conductive type impurity region having a second conductive type impurity characteristics opposite to the first conductive type impurity characteristics in a vicinity of a first surface region of the polysilicon film material. A second conductor layer overlies the second conductive type impurity region to form a photovoltaic cell.
展开▼
机译:一种形成光伏电池的方法。该方法包括提供第一硅材料,该第一硅材料的特征在于电阻率小于大约0.5 ohm cm -1 Sup>,并且具有第一导电类型的杂质特性。第一硅材料形成用于光伏电池的第一导体层。该方法在表面区域上方沉积多晶硅膜材料。在一个特定的实施方案中,多晶硅材料具有第一导电类型的杂质特性和大于约0.5ohm cm -1 Sup>的电阻率。在一个特定的实施方案中,第一多晶硅膜材料的特征在于晶粒尺寸大于约0.1mm。该方法在多晶硅膜材料的第一表面区域附近形成具有与第一导电类型杂质特性相反的第二导电类型杂质特性的第二导电类型杂质区域。第二导体层覆盖在第二导电类型杂质区域上以形成光伏电池。
展开▼