首页> 外国专利> SYSTEMATIC, NORMALIZED METRIC FOR ANALYZING AND COMPARING OPTIMIZATION TECHNIQUES FOR INTEGRATED CIRCUITS EMPLOYING VOLTAGE SCALING AND INTEGRATED CIRCUITS DESIGNED THEREBY

SYSTEMATIC, NORMALIZED METRIC FOR ANALYZING AND COMPARING OPTIMIZATION TECHNIQUES FOR INTEGRATED CIRCUITS EMPLOYING VOLTAGE SCALING AND INTEGRATED CIRCUITS DESIGNED THEREBY

机译:系统化,标准化的度量标准,用于分析和比较采用电压缩放的集成电路和由此设计的集成电路的优化技术

摘要

Various embodiments of methods of designing an integrated circuit (IC). One embodiment of one such method includes: (1) generating a functional design for the IC, (2) determining performance objectives for the IC, (3) determining an optimization target voltage for the IC, (4) determining whether the IC needs voltage scaling to achieve the performance objectives at the optimization target voltage and, if so, whether the IC is to employ static voltage scaling or adaptive voltage scaling, (5) using the optimization target voltage to synthesize a layout from the functional IC design that meets the performance objectives by employing a unitless performance/power quantifier as a metric to gauge a degree of optimization thereof and (6) performing a timing signoff of the layout at the optimization target voltage.
机译:设计集成电路(IC)的方法的各种实施例。一种这样的方法的一个实施例包括:(1)生成IC的功能设计,(2)确定IC的性能目标,(3)确定IC的优化目标电压,(4)确定IC是否需要电压缩放以在优化目标电压下达到性能目标;如果是,则是在IC是采用静态电压缩放还是自适应电压缩放的情况下,(5)使用优化目标电压从功能IC设计中合成满足以下要求的布局:通过采用无单位性能/功率量化器作为衡量其优化程度的指标,并(6)在优化目标电压下执行布局的时序签收,从而达到性能目标。

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