首页> 外国专利> LAMINATED FILM DEFECT INSPECTION METHOD AND LAMINATED FILM DEFECT INSPECTION DEVICE

LAMINATED FILM DEFECT INSPECTION METHOD AND LAMINATED FILM DEFECT INSPECTION DEVICE

机译:叠层膜缺陷检查方法及叠层膜缺陷检查装置

摘要

A first inspection process of inspecting presence of a defect on a front surface of a film body with a protective film separated therefrom; a separator removing process of separating a separator from the inspected laminated film; a second inspection process of inspecting presence of the defect in the film body in a vertical attitude while introducing the film body with the separator separated and removed therefrom to a film travel path directed in a vertical direction, and storing detection data; a separator laminating process and a protective film laminating process of laminating a separator and a protective film to a back surface and a front surface of the inspected film body, respectively; and a film collecting process of winding up the inspected laminated film laminated with the protective film and the separator are provided.
机译:第一检查过程是检查膜体的前表面上是否有缺陷,并分离出保护膜。从检查的层叠膜分离隔板的隔板去除工序。第2检查工序是将分离并除去了隔膜的膜体导入到铅直方向的膜行进路径,并且以铅直状态检查膜体内的缺陷的存在,并存储检测数据的第2检查工序。隔板层叠工序和保护膜层叠工序,其分别将隔板和保护膜层叠在被检查膜体的背面和表面上。设有将被保护膜和隔离膜层叠而成的被检查的层叠膜卷取的膜回收工序。

著录项

  • 公开/公告号US2010165333A1

    专利类型

  • 公开/公告日2010-07-01

    原文格式PDF

  • 申请/专利权人 HIROMICHI OHASHI;KOSUKE SATO;

    申请/专利号US20080376276

  • 发明设计人 KOSUKE SATO;HIROMICHI OHASHI;

    申请日2008-08-12

  • 分类号G01N21/896;

  • 国家 US

  • 入库时间 2022-08-21 18:53:31

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