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Defect inspection method for laminated optical film, optical film defect inspection method, and laminated optical film manufacturing method
Defect inspection method for laminated optical film, optical film defect inspection method, and laminated optical film manufacturing method
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机译:层压光学膜的缺陷检查方法,光学膜缺陷检查方法和层压光学膜制造方法
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摘要
According to one embodiment of the present invention, a method for inspecting a defect of a laminated optical film includes: a first inspection step for inspecting a defect of an optical film 11; a step for forming laminated optical films 10A, 10B by adhering a protection film 12 and an adhesive material 13 to the optical film 11; a first marking step for performing marking (of a mark 30) to the laminated optical film 10A corresponding to a defect 20 detected in the first inspection step; a second inspection step for inspecting a defect of the laminated optical film 10B; and a second marking step for performing marking (of a mark 31) to the laminated optical film 10B corresponding to a defect 21 detected in the second inspection step. In the second inspection step, the mark 30 marked in the first marking step is not detected.
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