首页> 外国专利> Defect inspection method for laminated optical film, optical film defect inspection method, and laminated optical film manufacturing method

Defect inspection method for laminated optical film, optical film defect inspection method, and laminated optical film manufacturing method

机译:层压光学膜的缺陷检查方法,光学膜缺陷检查方法和层压光学膜制造方法

摘要

According to one embodiment of the present invention, a method for inspecting a defect of a laminated optical film includes: a first inspection step for inspecting a defect of an optical film 11; a step for forming laminated optical films 10A, 10B by adhering a protection film 12 and an adhesive material 13 to the optical film 11; a first marking step for performing marking (of a mark 30) to the laminated optical film 10A corresponding to a defect 20 detected in the first inspection step; a second inspection step for inspecting a defect of the laminated optical film 10B; and a second marking step for performing marking (of a mark 31) to the laminated optical film 10B corresponding to a defect 21 detected in the second inspection step. In the second inspection step, the mark 30 marked in the first marking step is not detected.
机译:根据本发明的一个实施例,一种用于检查层压光学膜的缺陷的方法包括:第一检查步骤,用于检查光学膜的缺陷11;以及用于检查光学膜的缺陷的第一检查步骤。通过将保护膜12和粘合材料13粘附到光学膜11上来形成层压光学膜10A,10B的步骤;第一标记步骤,用于对与在第一检查步骤中检测到的缺陷20相对应的层压光学膜10A进行标记30的标记。第二检查工序是检查层叠光学膜10B的缺陷的工序。第二标记步骤是对与在第二检查步骤中检测出的缺陷21相对应的层叠光学膜10B进行标记(标记31)的标记的第二步骤。在第二检查步骤中,未检测到在第一标记步骤中标记的标记30。

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