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METHOD OF DETECTING CHANGES IN INTEGRATED CIRCUITS USING THERMALLY IMAGED TEST PATTERNS
METHOD OF DETECTING CHANGES IN INTEGRATED CIRCUITS USING THERMALLY IMAGED TEST PATTERNS
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机译:热成像测试模式检测综合电路变化的方法
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摘要
A method of testing an electrical circuit includes applying test vectors to a circuit, detecting thermal changes in portions of the circuit during application of the test vectors, and identifying unexpected activity corresponding to the thermal changes. The method supplements standard testing techniques to provide a new method of assessing operation of fabricated integrated circuits and programmed field programmable gate arrays.
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