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Contact device to contact an electrical test specimen to be tested and a corresponding contact process
Contact device to contact an electrical test specimen to be tested and a corresponding contact process
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机译:接触装置以接触要测试的电气测试样品以及相应的接触过程
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摘要
The invention relates to a contacting device for contacting an electrical test piece to be tested, in particular a test piece provided with tin-plated contacts, comprising at least two guide elements having openings through which contact elements pass essentially axially and which project from the test piece, on a side of the associated guide element facing the test piece, for contacting the test piece. The invention is characterized in that the axial distance between the guide elements or the axial position of the guide element facing the test piece may be adjusted to fit the projecting length.
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