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Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation
Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation
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机译:无需样品制备即可进行X射线衍射,荧光和晶体织构分析的仪器和方法
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摘要
An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.
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