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Integrated circuit wafer with inter-die metal interconnect lines traversing scribe-line boundaries

机译:具有穿过划线边界的管芯间金属互连线的集成电路晶片

摘要

A metal interconnect structure formed over a substrate in an integrated circuit that traverses a scribe-line boundary between a first die and a second die includes at least one metal interconnect line that traverses the scribe-line boundary. A switch is coupled between the at least one metal interconnect line and the substrate, the switch having a control element coupled to a scribe-cut control line. The control line turns the switch on if the two dice are separated into individual dice and turns the switch off if the two dice are to remain physically connected so that the interconnect line may be used to make connections between circuits on the two dice.
机译:跨过第一管芯和第二管芯之间的划线边界的,在集成电路中的衬底上方形成的金属互连结构包括至少一条横过划线边界的金属互连线。开关耦合在至少一条金属互连线和基板之间,该开关具有耦合至划片控制线的控制元件。如果将两个骰子分离成单独的骰子,则控制线将接通开关;如果两个骰子要保持物理连接,则控制线将断开开关,以便可以使用互连线在两个骰子上的电路之间建立连接。

著录项

  • 公开/公告号US7718512B2

    专利类型

  • 公开/公告日2010-05-18

    原文格式PDF

  • 申请/专利权人 JOHN MCCOLLUM;

    申请/专利号US20070695992

  • 发明设计人 JOHN MCCOLLUM;

    申请日2007-04-03

  • 分类号H01L21/00;

  • 国家 US

  • 入库时间 2022-08-21 18:51:13

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