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Methodology for bias temperature instability test
Methodology for bias temperature instability test
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机译:偏置温度不稳定性测试的方法
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摘要
A method for performing a bias temperature instability test on a device includes performing a first stress on the device. After the first stress, a first measurement is performed to determine a first parameter of the device. After the first measurement, a second stress is performed on the device, wherein only the first parameter is measured between the first stress and the second stress. The method further includes performing a second measurement to determine a second parameter of the device after the second stress. The second parameter is different from the first parameter.
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