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Integrated circuit having a memory cell arrangement and method for reading a memory cell state using a plurality of partial readings

机译:具有存储器单元布置的集成电路和用于使用多个部分读数来读取存储器单元状态的方法

摘要

Embodiments of the invention relate generally to an integrated circuit having a memory cell arrangement and a method for reading a memory cell state using a plurality of partial readings. In an embodiment of the invention, an integrated circuit having a memory cell arrangement is provided. The memory cell arrangement may include at least one memory cell, the memory cell being capable of storing a plurality of memory cell states being distinguishable by a predefined number of memory cell threshold values, and a controller configured to read a memory cell state of the at least one memory cell using a number of reference levels that is higher than the predefined number of memory cell threshold values, wherein the reading includes a first partial reading using a first set of a plurality of reference levels and a second partial reading using a second set of a plurality of reference levels, wherein the second set of a plurality of reference levels includes at least one reference level which is different from the reference levels of the first set of a plurality of reference levels.
机译:本发明的实施例总体上涉及一种具有存储单元布置的集成电路以及一种用于使用多个局部读数来读取存储单元状态的方法。在本发明的实施例中,提供了一种具有存储单元布置的集成电路。所述存储器单元布置可包括至少一个存储器单元,所述存储器单元能够存储可由预定义数量的存储器单元阈值区分的多个存储器单元状态,以及被配置为读取所述存储器单元的存储器单元状态的控制器。使用高于存储单元阈值的预定数量的多个参考电平的至少一个存储单元,其中该读取包括使用多个参考电平的第一组的第一部分读取和使用第二参考电平的第二部分读取在多个参考水平中,第一参考水平中的第二参考水平包括多个参考水平,其中第二参考水平中的第二参考水平包括与第一参考水平中的第一参考水平不同的至少一个参考水平。

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