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System and method for testing and providing an integrated circuit having multiple modules or submodules
System and method for testing and providing an integrated circuit having multiple modules or submodules
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机译:用于测试和提供具有多个模块或子模块的集成电路的系统和方法
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摘要
In an integrated circuit having a plurality of modules and/or submodules that each performs a substantially same function, defective modules and/or submodules are determined by creating a test signature from an input test pattern. The output of each module and/or submodule is compared with the test signature and defective modules to identify defective modules and/or submodules. The identity of defective modules/submodules is stored on the integrated circuit for subsequent use by a customer. Integrated circuits having one or more defective modules/submodules are sold to customers with full disclosure of which modules/submodules are defective, thereby improving the yield associated with the product. Pricing of the product is discounted for products with less than full functionality.
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